EconBiz - Find Economic Literature
    • Logout
    • Change account settings
  • A-Z
  • Beta
  • About EconBiz
  • News
  • Thesaurus (STW)
  • Academic Skills
  • Help
  •  My account 
    • Logout
    • Change account settings
  • Login
EconBiz - Find Economic Literature
Publications Events
Search options
Advanced Search history
My EconBiz
Favorites Loans Reservations Fines
    You are here:
  • Home
  • Search: person:"Chan, Chan‐Ieong"
Narrow search

Narrow search

Year of publication
Subject
All
Control charts 1 Operations and production 1 Performance measurement (quality) 1
Online availability
All
Undetermined 1
Type of publication
All
Article 3
Type of publication (narrower categories)
All
review-article 1
Language
All
Undetermined 2 English 1
Author
All
Chan, Chan-Ieong 2 Tse, Alan Ching Biu 2 Yim, Frederick H.K. 2 Chan, Chan‐Ieong 1 Ching Biu Tse, Alan 1 Yim, Frederick H. K. 1
Published in...
All
International journal of quality & reliability management 2 International Journal of Quality & Reliability Management 1
Source
All
OLC EcoSci 2 Other ZBW resources 1
Showing 1 - 3 of 3
Cover Image
Comparing and combining individual x ‐charts and x ‐bar charts
Chan, Chan‐Ieong; Ching Biu Tse, Alan; Yim, Frederick … - In: International Journal of Quality & Reliability Management 20 (2003) 7, pp. 827-835
Control charts have played an important role in monitoring the performance of operation processes, ever since their invention. Traditionally, according to Juran's idea and others, x ‐bar charts are more sensitive than individual x ‐charts. However, such a conclusion is valid only under...
Persistent link: https://www.econbiz.de/10014800208
Saved in:
Cover Image
Comparing and combining individual x-charts and x-bar charts
Chan, Chan-Ieong; Tse, Alan Ching Biu; Yim, Frederick H.K. - In: International journal of quality & reliability management 20 (2003) 6-7, pp. 827-835
Persistent link: https://www.econbiz.de/10006368093
Saved in:
Cover Image
Comparing and combining individual x-charts and x-bar charts
Chan, Chan-Ieong; Tse, Alan Ching Biu; Yim, Frederick H.K. - In: International journal of quality & reliability management 20 (2003) 6-7, pp. 827-835
Persistent link: https://www.econbiz.de/10006369175
Saved in:
A service of the
zbw
  • Sitemap
  • Plain language
  • Accessibility
  • Contact us
  • Imprint
  • Privacy

Loading...