EconBiz - Find Economic Literature
    • Logout
    • Change account settings
  • A-Z
  • Beta
  • About EconBiz
  • News
  • Thesaurus (STW)
  • Academic Skills
  • Help
  •  My account 
    • Logout
    • Change account settings
  • Login
EconBiz - Find Economic Literature
Publications Events
Search options
Advanced Search history
My EconBiz
Favorites Loans Reservations Fines
    You are here:
  • Home
  • Search: person:"Chen, Jann‐Pygn"
Narrow search

Narrow search

Year of publication
Subject
All
Process efficiency 3 Statistics 2 Customer requirements 1 Measurement 1 Process analysis 1 Process control 1 Process management 1
more ... less ...
Online availability
All
Undetermined 3
Type of publication
All
Article 7
Type of publication (narrower categories)
All
research-article 3
Language
All
Undetermined 4 English 3
Author
All
Chen, Jann-Pygn 4 Chen, Jann‐Pygn 3 Chen, K.S. 3 Ding, Cherng G. 2 Tong, Lee-Ing 1 Tong, Lee‐Ing 1
Published in...
All
International Journal of Quality & Reliability Management 3 International journal of quality & reliability management 3 Journal of quality technology : a quarterly journal of methods, applications and related topics 1
Source
All
OLC EcoSci 4 Other ZBW resources 3
Showing 1 - 7 of 7
Cover Image
Comparison of two process capabilities by using indices C pm : an application to a color STN display
Chen, Jann‐Pygn; Chen, K.S. - In: International Journal of Quality & Reliability Management 21 (2004) 1, pp. 90-101
Recent years have seen mounting interest in measuring process performance in the manufacturing industry. Analysis of process capability indices allows a production department to trace and improve a poor process to enhance quality and satisfy customers. Process capability analysis can also serve...
Persistent link: https://www.econbiz.de/10014800230
Saved in:
Cover Image
Comparing the Capability of Two Process Using Cpm
Chen, Jann-Pygn; Chen, K.S. - In: Journal of quality technology : a quarterly journal of … 36 (2004) 3, pp. 329-335
Persistent link: https://www.econbiz.de/10006550383
Saved in:
Cover Image
Comparison of two process capabilities by using indices Cpm: an application to a color STN display
Chen, Jann-Pygn; Chen, K.S. - In: International journal of quality & reliability management 21 (2004) 1, pp. 90-101
Persistent link: https://www.econbiz.de/10006367351
Saved in:
Cover Image
A new process capability index for non‐normal distributions
Chen, Jann‐Pygn; Ding, Cherng G. - In: International Journal of Quality & Reliability Management 18 (2001) 7, pp. 762-770
Many process capability indices have been proposed to measure process performance. In this paper, we first review C p , C pk , C pm and C pmk , and their generalizations, C Np , C Npk , C Npm and C Npmk , and then propose a new index S pmk for any underlying distribution, which takes into...
Persistent link: https://www.econbiz.de/10014800102
Saved in:
Cover Image
Number 7 - A new process capability index for non-normal distributions
Chen, Jann-Pygn; Ding, Cherng G. - In: International journal of quality & reliability management 18 (2001) 6-7, pp. 762-770
Persistent link: https://www.econbiz.de/10006378810
Saved in:
Cover Image
Lower confidence limits of process capability indices for non‐normal process distributions
Tong, Lee‐Ing; Chen, Jann‐Pygn - In: International Journal of Quality & Reliability Management 15 (1998) 8/9, pp. 907-919
When the process probability distribution is non‐normal or is unknown, the process mean and standard deviation may not properly describe the distribution’s shape. Consequently, the traditional process capability indices (PCI) C p , C pk , C pm and C pmk cannot express the actual process...
Persistent link: https://www.econbiz.de/10014801183
Saved in:
Cover Image
Lower confidence limits of process capability indices for non-normal process distributions
Tong, Lee-Ing; Chen, Jann-Pygn - In: International journal of quality & reliability management 15 (1998) 8-9, pp. 907-919
Persistent link: https://www.econbiz.de/10006391798
Saved in:
A service of the
zbw
  • Sitemap
  • Plain language
  • Accessibility
  • Contact us
  • Imprint
  • Privacy

Loading...