Genadis, Themis C. - In: International Journal of Quality & Reliability Management 13 (1996) 9, pp. 61-74
Presents a cost‐optimization model for determining optimal burn‐in times at the module/system level of an electronic product. Optimum burn‐in is determined as that which will be most cost‐effective when considering burn‐in cost, field failure savings and the impact on system reliability.