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Search: person:"Gieser, H."
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Egger, P.
4
Gieser, H.
4
Russ, C.
3
Guggenmos, X.
2
Verhaege, K.
2
Gieser, H.A.
1
Groeseneken, G.
1
Herrmann, M.R.
1
Iri, S.
1
Kropf, R.
1
Kuper, F.G.
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Maes, H.E.
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Reiner, J.C.
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Roussel, P.J.
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Quality and reliability engineering international
5
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OLC EcoSci
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1
ESD Monitor Circuit -- A Tool to Investigate the Susceptibility and Failure Mechanisms of the Charged Device Model
Egger, P.
;
Gieser, H.
;
Kropf, R.
;
Guggenmos, X.
- In:
Quality and reliability engineering international
12
(
1996
)
4
,
pp. 265-270
Persistent link: https://www.econbiz.de/10006403126
Saved in:
2
ESD Protection Elements during HBM Stress Tests -- Further Numerical and Experimental Results
Russ, C.
;
Gieser, H.
;
Verhaege, K.
- In:
Quality and reliability engineering international
11
(
1995
)
4
,
pp. 285-294
Persistent link: https://www.econbiz.de/10006404877
Saved in:
3
A CDM-only Reproducible Field Degradation and its Reliability Aspect
Gieser, H.A.
;
Egger, P.
;
Reiner, J.C.
;
Herrmann, M.R.
- In:
Quality and reliability engineering international
10
(
1994
)
4
,
pp. 341-350
Persistent link: https://www.econbiz.de/10006408717
Saved in:
4
Compact Electro-thermal Simulation of ESD-protection Elements
Russ, C.
;
Gieser, H.
;
Egger, P.
;
Iri, S.
- In:
Quality and reliability engineering international
10
(
1994
)
4
,
pp. 335-340
Persistent link: https://www.econbiz.de/10006408718
Saved in:
5
Analysis of HBM ESD Testers and Specifications using a Fourth-order Lumped Element Model
Verhaege, K.
;
Roussel, P.J.
;
Groeseneken, G.
;
Maes, H.E.
; …
- In:
Quality and reliability engineering international
10
(
1994
)
4
,
pp. 325-334
Persistent link: https://www.econbiz.de/10006408719
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