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~subject:"Stochastic process"
~person:"Kim, Myungsup"
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Stochastic process
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Kim, Myungsup
Kim, Young Shin
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Fabozzi, Frank J.
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Račev, Svetlozar T.
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Bianchi, Michele Leonardo
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Kim, Yangseon
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Journal of productivity analysis
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On the accuracy of bootstrap confidence intervals for efficiency levels in stochastic frontier models with panel data
Kim, Myungsup
;
Kim, Yangseon
;
Schmidt, Peter
- In:
Journal of productivity analysis
28
(
2007
)
3
,
pp. 165-181
Persistent link: https://www.econbiz.de/10003617115
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