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  • Search: person:"Mladenov, G"
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3D mathematical model 1 Electron beam lithography (EBL) 1 Monte Carlo methods 1 Shadowing effect 1 Superconductor thin films 1 Textured sample surface 1 X-ray photoelectron spectra (XPS) 1 XPS angular intensity distribution 1
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Mladenov, G 2 Vutova, K 2 Gueorguiev, Y 1 Kawabata, K 1 Tanaka, T 1
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Mathematics and Computers in Simulation (MATCOM) 2
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RePEc 2
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Evaluation of thin film surface topology shapes
Vutova, K; Mladenov, G; Tanaka, T; Kawabata, K - In: Mathematics and Computers in Simulation (MATCOM) 49 (1999) 4, pp. 275-283
In this paper we propose mathematical model for calculating XPS intensity distribution from the textured sample surface. The surface roughness is approximated using different 3D geometrical shapes (triangular prisms, cone-shaped rings). Analytical expressions for XPS intensity calculation are...
Persistent link: https://www.econbiz.de/10010749566
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Numerical modelling of the processes of exposure and development in electron beam lithography on high temperature superconductor thin films
Gueorguiev, Y; Vutova, K; Mladenov, G - In: Mathematics and Computers in Simulation (MATCOM) 47 (1998) 2, pp. 299-307
In the present work a numerical modelling of the processes of exposure and development of the resist during electron beam lithography (EBL) on structures incorporating YBa2Cu3O7 high temperature superconductor (HTS) thin films is performed. Monte Carlo method is used to simulate the penetration...
Persistent link: https://www.econbiz.de/10011050577
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