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68.55.-a Thin film structure and morphology
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68.55.Ac Nucleation and growth: microscopic aspects
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81.07.-b Nanoscale materials and structures: fabrication and characterization
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PACS. 61.10.Eq X-ray scattering (including small-angle scattering)
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Chamard, V.
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Dolino, G.
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Pichat, C.
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The European Physical Journal B - Condensed Matter and Complex Systems
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Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction
Chamard, V.
;
Pichat, C.
;
Dolino, G.
- In:
The European Physical Journal B - Condensed Matter and …
21
(
2001
)
2
,
pp. 185-190
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