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Chen, K.S.
Tong, Lee-Ing
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International journal of quality & reliability management
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Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
Tong, Lee-Ing
;
Chen, K.S.
;
Chen, H.T.
- In:
International journal of quality & reliability management
19
(
2002
)
6-7
,
pp. 812-824
Persistent link: https://www.econbiz.de/10006373618
Saved in:
2
Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
Tong, Lee-Ing
;
Chen, K.S.
;
Chen, H.T.
- In:
International journal of quality & reliability management
19
(
2002
)
7
,
pp. 812-824
Persistent link: https://www.econbiz.de/10006373837
Saved in:
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