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Article 8
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Yum, B.-J. 4 Yum, B. 2 Yum, B.J. 2 Cho, J.-G. 1 Cho, J.G. 1 Kim, J. 1 Kim, S.-J. 1 Lim, H. 1 Park, J.-W. 1 Seo, S. 1 Seo, S.-K. 1 Seo, S.K. 1
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IEEE transactions on reliability : R ; IEEE T R 2 International journal of industrial engineering : applications and practice 1 International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers 1 Journal of the Operational Research Society : OR 1 Naval research logistics : an international journal 1 Quality and reliability engineering international 1 Reliability engineering & system safety 1
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OLC EcoSci 8
Showing 1 - 8 of 8
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Planning Performance Degradation Tests -- A Review
Yum, B.-J.; Lim, H.; Seo, S.-K. - In: International journal of industrial engineering : … 14 (2007) 4, pp. 372-381
Persistent link: https://www.econbiz.de/10007910639
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Functional estimation of activity criticality indices and sensitivity analysis of expected project completion time
Cho, J.-G.; Yum, B.-J. - In: Journal of the Operational Research Society : OR 55 (2004) 8, pp. 850-859
Persistent link: https://www.econbiz.de/10006022294
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An uncertainty importance measure of activities in PERT networks
Cho, J.G.; Yum, B.J. - In: International journal of production research : American … 35 (1997) 10, pp. 2737-2758
Persistent link: https://www.econbiz.de/10006138998
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Optimal Design of Accelerated Life Tests with Two Stresses
Park, J.-W.; Yum, B.-J. - In: Naval research logistics : an international journal 43 (1996) 6, pp. 863-884
Persistent link: https://www.econbiz.de/10005992355
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A Failure-Censored Life Test Procedure for Exponential Distribution
Seo, S.K.; Yum, B.J. - In: Reliability engineering & system safety 41 (1993) 3, pp. 245-250
Persistent link: https://www.econbiz.de/10006869447
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A heuristic method for solving redundancy optimization problems in complex systems
Kim, J.; Yum, B. - In: IEEE transactions on reliability : R ; IEEE T R 42 (1993) 4, pp. 572-578
Persistent link: https://www.econbiz.de/10006639149
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Estimation Methods for the Mean of the Exponential Distribution Based on Grouped & Censored Data
Seo, S.; Yum, B. - In: IEEE transactions on reliability : R ; IEEE T R 42 (1993) 1, pp. 87-96
Persistent link: https://www.econbiz.de/10006639258
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On Parameter Design of Binary-input-and-binary-output Dynamic Systems
Yum, B.-J.; Kim, S.-J. - In: Quality and reliability engineering international 9 (1993) 6, pp. 471-476
Persistent link: https://www.econbiz.de/10006413391
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