This work deals with the strain relaxation mechanism in InGaAs metamorphic buffers (MBs) grown on GaAs substrates and overgrown by InAs quantum dots (QD). The residual strain is measured by using Raman scattering and X-ray diffraction, both in Reciprocal Space Map and in single ω-2θ scan modes...

Orbital ordering (OO) in La<Subscript>0.5</Subscript>Sr<Subscript>1.5</Subscript>MnO<Subscript>4</S ubscript> has been studied using soft X-ray resonant diffraction (SXRD) at the Mn L<Subscript>2,3</Subscript> edges in combination with many-body cluster calculations. The SXRD intensity is modelled in second quantization using a small planar cluster consisting of a central active Mn site...</subscript><//s></subscript></subscript></subscript>

Results of simultaneous thermal analysis (STA), synchrotron powder diffraction (in the range 300–973 K) and inelastic neutron scattering (at 285 and 505 K) on non-superionic β- and superionic α-AgCuSe are reported. The sample is stable in argon on heating. The volume change at the...

We report the first X-ray scattering investigation of spatial variations of the q-fold quasicrystalline symmetry (so-called commensurability) of well-aligned TGB<Subscript>C</Subscript> samples. A spatial resolution of 20 × 40 μm<Superscript>2</Superscript> was achieved using the ESRF microfocus beamline. The liquid crystal samples, contained...</superscript></subscript>