//--> //--> //-->
Toggle navigation
Logout
Change account settings
EN
DE
ES
FR
A-Z
Beta
About EconBiz
News
Thesaurus (STW)
Academic Skills
Help
EN
DE
ES
FR
My account
Logout
Change account settings
Login
Publications
Events
Your search terms
Search
Search options
All Fields
Title
Exact title
Subject
Author
Institution
ISBN/ISSN
Published in...
Publisher
Open Access only
Advanced
Search history
My EconBiz
Favorites
Loans
Reservations
Fines
You are here:
Home
Search: subject:"61.16.Ch Scanning probe microscopy: scanning tunneling"
Narrow search
Narrow search
Year of publication
From:
To:
Subject
All
61.16.Ch Scanning probe microscopy: scanning tunneling
1
71.20.Lp Intermetallic compounds
1
PACS. 61.14.Hg Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED) –
1
atomic force
1
etc. –
1
magnetic force
1
scanning optical
1
more ...
less ...
Online availability
All
Undetermined
1
Type of publication
All
Article
1
Language
All
Undetermined
1
Author
All
Dufour, C.
1
Dumesnil, K.
1
Maloufi, N.
1
Mangin, Ph.
1
Mougin, A.
1
Published in...
All
The European Physical Journal B - Condensed Matter and Complex Systems
1
Source
All
RePEc
1
Showing
1
-
1
of
1
Sort
relevance
articles prioritized
date (newest first)
date (oldest first)
1
From anisotropic dots to smooth RFe<Subscript> <Emphasis Type="Bold">2 </Subscript>(110) single crystal layers (R=rare earth)
Mougin, A.
;
Dufour, C.
;
Maloufi, N.
;
Dumesnil, K.
; …
- In:
The European Physical Journal B - Condensed Matter and …
19
(
2001
)
2
,
pp. 289-296
Persistent link: https://www.econbiz.de/10009282830
Saved in:
Results per page
10
25
50
100
250
A service of the
zbw
×
Loading...
//-->