Sun, Xia; Fu, Zhuxi; Wu, Ziqin - In: Physica A: Statistical Mechanics and its Applications 311 (2002) 3, pp. 327-338
The surface topographies of as-sputtered and annealed ZnO films were measured by atomic force microscope (AFM …). Multifractal behavior of AFM images has been analyzed by box-counting method. It is found that the scaling range can be extended …
