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  • Search: subject:"Accelerated testing"
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Year of publication
Subject
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accelerated testing 4 development programs 3 dynamic programming 3 multiple-state design reliability 3 one-shot systems 3 optimal programs 3 redesign 3 test 3 Theorie 2 Theory 2 Accelerated Testing 1 Accelerated testing 1 Acceptance Sampling Plan 1 Bootstrap method 1 Conditional moment generating function 1 Coverage probability 1 Cumulative exposure model 1 Dynamic programming 1 Dynamische Optimierung 1 Exponential Distribution 1 Exponential distribution 1 Mathematical programming 1 Mathematische Optimierung 1 Maximum likelihood estimation 1 Optimization 1 Order statistics 1 Progressive Type-II Censoring 1 Sampling 1 Step-stress models 1 Stichprobenerhebung 1 Tail probability 1 Type-I censoring 1 acceptance sampling plan 1 exponential distribution 1 optimisation 1 process capability index 1 progressive type-II censoring 1
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Online availability
All
Free 3 Undetermined 3
Type of publication
All
Article 3 Book / Working Paper 3
Type of publication (narrower categories)
All
Working Paper 2 Arbeitspapier 1 Article in journal 1 Aufsatz in Zeitschrift 1 Graue Literatur 1 Non-commercial literature 1
Language
All
English 4 Undetermined 2
Author
All
Vardeman, Stephen B. 3 Kumar, Mahesh 2 Ramyamol, P. C. 2 Shevasuthislip, Suntichai 2 Balakrishnan, N. 1 Kundu, D. 1 Shevasuthisilp, Suntichai 1 Xie, Qihao 1
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Institution
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Institut für Wirtschafts- und Sozialstatistik, Universität Dortmund 1
Published in...
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Annals of the Institute of Statistical Mathematics 1 International journal of productivity and quality management : IJPQM 1 Stochastics and Quality Control 1 Technical Report 1 Technical Reports / Institut für Wirtschafts- und Sozialstatistik, Universität Dortmund 1 Technical report / Sonderforschungsbereich 475 Komplexitätsreduktion in Multivariaten Datenstrukturen, Universität Dortmund 1
Source
All
ECONIS (ZBW) 2 RePEc 2 EconStor 1 Other ZBW resources 1
Showing 1 - 6 of 6
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Optimal reliability acceptance sampling plan based on accelerated life test data
Ramyamol, P. C.; Kumar, Mahesh - In: International journal of productivity and quality … 30 (2020) 3, pp. 354-370
Persistent link: https://www.econbiz.de/10012256636
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Optimal Design of Reliability Acceptance Sampling Plan Based on Sequential Order Statistics
Kumar, Mahesh; Ramyamol, P. C. - In: Stochastics and Quality Control 34 (2019) 2, pp. 87-94
Abstract The concept of sequential order statistics were introduced by Kamps in 1995. In this article, we derive an acceptance sampling plan, for units having exponentially distributed lifetime, using sequential order statistics. Based on data obtained from progressive type II censoring using...
Persistent link: https://www.econbiz.de/10014591040
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Development programs for one-shot systems using multiple-state design reliability models
Shevasuthislip, Suntichai; Vardeman, Stephen B. - 2003
Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first...
Persistent link: https://www.econbiz.de/10010306232
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Development programs for one-shot systems using multiple-state design reliability models
Shevasuthislip, Suntichai; Vardeman, Stephen B. - Institut für Wirtschafts- und Sozialstatistik, … - 2003
Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first...
Persistent link: https://www.econbiz.de/10009295208
Saved in:
Cover Image
Development programs one-shot systems using multiple-state design reliability models
Shevasuthisilp, Suntichai; Vardeman, Stephen B. - 2003
Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first...
Persistent link: https://www.econbiz.de/10010477497
Saved in:
Cover Image
Exact inference for a simple step-stress model from the exponential distribution under time constraint
Balakrishnan, N.; Xie, Qihao; Kundu, D. - In: Annals of the Institute of Statistical Mathematics 61 (2009) 1, pp. 251-274
Persistent link: https://www.econbiz.de/10005169240
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