Search Results - subject:"Atomic force microscope"

SURFACE MORPHOLOGY AND X-RAY DIFFRACTION ANALYSIS FOR SILICON NANOCRYSTAL-BASED HETEROSTRUCTURES

SALIM, EVAN T. - In: Surface Review and Letters (SRL) 20 (2013) 05, pp. 1350046-1

In this work, we studied the effect of rapid thermal oxidation process on the structural and surface morphology of silicon nanocrystal-based heterostructures. PLD technique was employed in combination with rapid thermal oxidation process to form multilayers heterostructures. Results show the...

Persistent link: https://www.econbiz.de/10010700495

DISPERSION AND FIXATION OF ADENO-ASSOCIATED VIRUS WITH GLUTARALDEHYDE FOR AFM STUDIES

WANG, PENG; WANG, XINYAN; YANG, HAIJUN; LÜ, JUNHONG - In: Surface Review and Letters (SRL) 15 (2008) 05, pp. 595-598

Sample preparation is an important procedure for atomic force microscope (AFM) studies. However, flexible virus …

Persistent link: https://www.econbiz.de/10005050541