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~type_genre:"Multi-volume publication"
~person:"Basetto, Samuel"
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Halbleiterindustrie
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Basetto, Samuel
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International journal of production research
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ECONIS (ZBW)
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Quality and exposure control in semiconductor manufacturing, Part II : Evaluation
Bettayeb, Belgacem
;
Basetto, Samuel
;
Vialletelle, Philippe
- In:
International journal of production research
50
(
2012
)
23
,
pp. 6852-6869
Persistent link: https://www.econbiz.de/10010219444
Saved in:
2
Quality and exposure control in semiconductor manufacturing, Part I : Modelling
Bettayeb, Belgacem
;
Basetto, Samuel
;
Vialletelle, Philippe
- In:
International journal of production research
50
(
2012
)
23
,
pp. 6835-6851
Persistent link: https://www.econbiz.de/10009674375
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