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Search: subject:"Defect detection"
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International journal of product development : IJPD
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Business systems research : a system view accross technology & economics : the journal of Society for Advancing Innovation and Research in Economy
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Impact of test effort in software development life cycle for effective defect management
Suma, V.
;
Nair, T. R. Gopalakrishnan
- In:
International journal of productivity and quality …
13
(
2014
)
3
,
pp. 251-271
Persistent link: https://www.econbiz.de/10010389514
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