Cravero, M; Iabichino, G; Kaniadakis, G; Miraldi, E; … - In: Physica A: Statistical Mechanics and its Applications 340 (2004) 1, pp. 410-417
In order to study the relation between the ohmic resistance measured in a thin conducting ribbon and the length of a transversal cut, we employ a one-parameter deformed exponential and logarithm that were recently introduced (Phys. Rev. E 66 (2002) 056125) in the framework of a generalized...
