Pun, Kelvin P. L.; Rotanson, Jason; Cheung, Chee-wah; … - In: Journal of Industrial Engineering and Management (JIEM) 12 (2019) 1, pp. 176-200
and Effect Analysis (FMEA), followed by process characterization on the high risk failure mode and Critical Parameter …, expected lifetime, and yield requirement to identify and prioritize the critical failure mode in the subsequent Failure Mode …