Härdle, Wolfgang (contributor); Mungo, Julius (contributor) - 2008
Memory ; Fractional Integrated Volatility Models …, C53, G12
Keywords: Backtesting, Value-at-Risk, Expected Shortfall, Long Mem-
ory, Fractional Integrated Volatility … Models
Acknowledgement: This research was supported by the Deutsche
Forschungsgemeinschaft through the SFB 649 ‘Economic Risk …