EconBiz - Find Economic Literature
    • Logout
    • Change account settings
  • A-Z
  • Beta
  • About EconBiz
  • News
  • Thesaurus (STW)
  • Academic Skills
  • Help
  •  My account 
    • Logout
    • Change account settings
  • Login
EconBiz - Find Economic Literature
Publications Events
Search options
Advanced Search history
My EconBiz
Favorites Loans Reservations Fines
    You are here:
  • Home
  • Search: subject:"HIT (hetro-junction intrinsic thin layer silicon)"
Narrow search

Narrow search

Year of publication
Subject
All
Amorphous silicon 1 Degradation 1 HIT (hetro-junction intrinsic thin layer silicon) 1 Multi-crystalline silicon 1 Photovoltaic technologies 1 Reliability 1
Online availability
All
Undetermined 1
Type of publication
All
Article 1
Language
All
Undetermined 1
Author
All
Bora, Birinchi 1 Chandel, S.S. 1 Kumar, Arun 1 Sastry, O.S. 1 Sharma, Vikrant 1
Published in...
All
Energy 1
Source
All
RePEc 1
Showing 1 - 1 of 1
Cover Image
Degradation analysis of a-Si, (HIT) hetro-junction intrinsic thin layer silicon and m-C-Si solar photovoltaic technologies under outdoor conditions
Sharma, Vikrant; Sastry, O.S.; Kumar, Arun; Bora, Birinchi - In: Energy 72 (2014) C, pp. 536-546
junction silicon), HIT (hetro-junction intrinsic thin layer silicon) and m-C-Si (multi-crystalline silicon) is carried out …
Persistent link: https://www.econbiz.de/10011055739
Saved in:
A service of the
zbw
  • Sitemap
  • Plain language
  • Accessibility
  • Contact us
  • Imprint
  • Privacy

Loading...