QIN, WENFENG; XIONG, JIE; LI, YANRONG - In: Surface Review and Letters (SRL) 16 (2009) 03, pp. 493-497
The dielectric properties of Ba0.6Sr0.4TiO3 (BST) thin films deposited using SrRuO3 (SRO) materials as bottom electrode were compared with those of the films grown using La0.5Sr0.5CoO3 (LSCO) materials as bottom electrode. X-ray diffraction scanning revealed that the two kinds of films could be...