Zeng, Z. M.; Wang, Y.; Han, X. F.; Zhan, W. S.; Zhang, Z. - In: The European Physical Journal B - Condensed Matter and … 52 (2006) 2, pp. 205-208
Bias voltage and temperature dependence of magneto-electric properties in double-barrier magnetic tunnel junctions(DBMTJs) with a structure of [IrMn/CoFe/Ru/CoFeB]/Al-O/CoFeB/Al-O/[CoFeB/Ru/CoFe/IrMn], have been investigated. The DBMTJs show a large tunnel magnetoresistance (TMR) ratio of up to...