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  • Search: subject:"Micro-structure noise"
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Year of publication
Subject
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Importance sampling 4 Maximum likelihood estimation 4 Micro-structure noise 4 Realised variance 4 Stochastic volatility model 4 Prognoseverfahren 2 Volatilität 2 Zeitreihenanalyse 2 Analysis of variance 1 Forecasting model 1 Maximum-Likelihood-Methode 1 Maximum-Likelihood-Schätzung 1 Sampling 1 Stichprobenerhebung 1 Stochastic process 1 Stochastischer Prozess 1 Theorie 1 Theory 1 Time series analysis 1 Varianzanalyse 1 Volatility 1
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Online availability
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Free 4
Type of publication
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Book / Working Paper 4
Type of publication (narrower categories)
All
Working Paper 2 Arbeitspapier 1 Graue Literatur 1 Non-commercial literature 1
Language
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English 2 Undetermined 2
Author
All
Jungbacker, B. 3 Koopman, S.J. 3 Jungbacker, Borus 1 Koopman, Siem Jan 1
Institution
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Tinbergen Institute 1 Tinbergen Instituut 1
Published in...
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Tinbergen Institute Discussion Papers 2 Discussion paper / Tinbergen Institute 1 Tinbergen Institute Discussion Paper 1
Source
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RePEc 2 ECONIS (ZBW) 1 EconStor 1
Showing 1 - 4 of 4
Cover Image
Model-based Measurement of Actual Volatility in High-Frequency Data
Jungbacker, B.; Koopman, S.J. - 2005
micro-structure noise, the estimator diverges. Parametric and nonparametric methods can be adopted to account for the micro …-structure bias. Here we measure actual volatility using a model that takes account of micro-structure noise together with intra …
Persistent link: https://www.econbiz.de/10010325421
Saved in:
Cover Image
Model-based Measurement of Actual Volatility in High-Frequency Data
Jungbacker, B.; Koopman, S.J. - Tinbergen Institute - 2005
micro-structure noise, the estimator diverges. Parametric and nonparametric methods can be adopted to account for the micro …-structure bias. Here we measure actual volatility using a model that takes account of micro-structure noise together with intra …
Persistent link: https://www.econbiz.de/10005137287
Saved in:
Cover Image
Model-based Measurement of Actual Volatility in High-Frequency Data
Jungbacker, B.; Koopman, S.J. - Tinbergen Instituut - 2005
micro-structure noise, the estimator diverges. Parametric and nonparametric methods can be adopted to account for the micro …-structure bias. Here we measure actual volatility using a model that takes account of micro-structure noise together with intra …
Persistent link: https://www.econbiz.de/10011255617
Saved in:
Cover Image
Model-based measurement of actual volatility in high-frequency data
Jungbacker, Borus; Koopman, Siem Jan - 2004
micro-structure noise, the estimator diverges. Parametric and nonparametric methods can be adopted to account for the micro …-structure bias. Here we measure actual volatility using a model that takes account of micro-structure noise together with intra …
Persistent link: https://www.econbiz.de/10011342558
Saved in:
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