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Asymmetric tolerance 1 Decision making rule 1 Normally distributed process 1 Process yield 1
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Chen, K. S. 1 Lin, P. C. 1 Pearn, W. L. 1
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The C”<Subscript>pk</Subscript> index for asymmetric tolerances: Implications and inference
Pearn, W. L.; Lin, P. C.; Chen, K. S. - In: Metrika 60 (2004) 2, pp. 119-136
The process capability index C<Subscript>pk</Subscript> has been widely used in the manufacturing industry to provide numerical measures on process performance. Since C<Subscript>pk</Subscript> is a yield-based index which is independent of the target T, it fails to account for process centering with symmetric tolerances, and presents an...</subscript></subscript>
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