Biswas, Shovan; Maiti, Sudhansu S. - In: Stochastics and Quality Control 37 (2022) 1, pp. 85-99
Abstract This article develops multiple dependent state (MDS) sampling inspection plans based on the mean of lifetime quality characteristic that follows non-normal distributions viz., exponential and Lindley distribution.
In this plan, the lot quality is measured by the lot mean (𝜇).
We have...