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Search: subject:"Out-of-sample Forecasting Analysis"
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Margin: the journal of applied economic research
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Long-memory modelling and forecasting of the returns and volatility of Exchange-traded Notes (ETNs)
Masa, Argel S.
;
Diaz, John Francis T.
- In:
Margin: the journal of applied economic research
11
(
2017
)
1
,
pp. 23-53
Persistent link: https://www.econbiz.de/10011690923
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