da Silva, Roberto; Brusamarello, Lucas; Wirth, Gilson I. - In: Physica A: Statistical Mechanics and its Applications 389 (2010) 14, pp. 2687-2699
Random Telegraph Signals (RTS) has become a major source of variability in the electrical behavior of modern transistors. The major contribution of this work is a new model based on a Monte Carlo algorithm for the mechanisms leading to RTS noise in semiconductor devices. To describe the...
