Search Results - subject:"Process yield"

Development of the yield-based process capability index, Cpy, to flexibly and accurately measure conformance

Kenyon, George N.; Sale, R. Samual; Hozak, Kurt; Chiou, Paul - In: International journal of quality & reliability management 33 (2016) 7, pp. 882-899

Persistent link: https://www.econbiz.de/10011603959

A new process capability index for multiple quality characteristics based on principal components

Dharmasena, L. S.; Zeephongsekul, Panlop - In: International journal of production research 54 (2016) 15/16, pp. 4617-4633

Persistent link: https://www.econbiz.de/10011518916

Development of the yield-based process capability index, C py , to flexibly and accurately measure conformance

Kenyon, George N; Sale, R. Samual; Hozak, Kurt; Chiou, Paul - In: International Journal of Quality & Reliability Management 33 (2016) 7, pp. 882-899

Purpose – The purpose of this paper is to develop an yield-based process capability index (PCI), C py , to overcome the shortcomings of existing PCIs that limit their use and lead to inaccurate measures of quality conformance under a variety of common conditions. Design/methodology/approach...

Persistent link: https://www.econbiz.de/10014801460

Univariate and multivariate process yield indices based on location-scale family of distributions

Dharmasena, L. S.; Zeephongsekul, Panlop - In: International journal of production research 52 (2014) 11, pp. 3348-3365

Persistent link: https://www.econbiz.de/10010357013

An improved approach for process performance evaluation with the consideration of process yield and quality loss

Wu, Chien-wei; Lin, Chi-wei; Chen, James C. - In: International journal of production research 51 (2013) 21, pp. 6397-6409

Persistent link: https://www.econbiz.de/10010228988

Efficient methods for comparing two process yields : strategies on supplier selection

Wu, Chien-wei; Liao, Mou-yuan; Yang, Tsung-tse - In: International journal of production research 51 (2013) 5, pp. 1587-1602

Persistent link: https://www.econbiz.de/10009705713

An improved approach for constructing lower confidence bound on process yield

Wu, Chien-Wei; Liao, Mou-Yuan; Chen, James C. - In: European Journal of Industrial Engineering 6 (2012) 3, pp. 369-390

Process yield, the percentage of processed product units passing inspection, is a standard numerical measure of process … performance in manufacturing industry. Based on the expression of process yield, Boyles (1994) presented a yield-measure index, S … rate. Therefore, this article recommends GCIs approach for assessing the process yield in real applications. [Received 4 …

Persistent link: https://www.econbiz.de/10010667491

Yield measure for the process with multiple streams

Wang, Dja-Shin; Koo, Tong-Yuan; Chou, Chao-Yu - In: Quality & Quantity: International Journal of Methodology 43 (2009) 4, pp. 661-668

Persistent link: https://www.econbiz.de/10009391024

Process Capability Evaluation for the Process of Product Families

Chen, K.; Huang, M. - In: Quality & Quantity: International Journal of Methodology 41 (2007) 1, pp. 151-162

Persistent link: https://www.econbiz.de/10009396234

Graphical Analysis of Capability of a Process Producing a Product Family

Huang, M.; Chen, K.; Li, R. - In: Quality & Quantity: International Journal of Methodology 39 (2005) 5, pp. 643-657

Persistent link: https://www.econbiz.de/10009391206