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  • Search: subject:"Simple step-stress"
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Year of publication
Subject
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Cumulative exposure model 2 Maximum likelihood estimation 2 Accelerated life test 1 Confidence intervals 1 Likelihood ratio test 1 Log-logistic distribution 1 Progressive Type-I hybrid censoring 1 Reliability 1 Simple step-stress 1 Simple step-stress accelerated life test 1 Weibull distribution 1 accelerated life testing 1 exact confidence intervals 1 exponential distribution 1 likelihood inference 1 progressive censoring with fixed censoring times 1 simple step‐stress model 1
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Online availability
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Undetermined 2 Free 1
Type of publication
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Article 3
Type of publication (narrower categories)
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Article 1
Language
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Undetermined 2 English 1
Author
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Cramer, Erhard 1 Ebrahem, Mohammed Al-Haj 1 Laumen, Benjamin 1 Li, Minghai 1 Ling, Li 1 Xu, Wei 1
Published in...
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METRON 1 Mathematics and Computers in Simulation (MATCOM) 1 Naval Research Logistics (NRL) 1
Source
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RePEc 2 EconStor 1
Showing 1 - 3 of 3
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Stage life testing
Laumen, Benjamin; Cramer, Erhard - In: Naval Research Logistics (NRL) 66 (2019) 8, pp. 632-647
time or to a simple-step stress model. Furthermore, assuming a cumulative exposure model, we establish exact inferential …
Persistent link: https://www.econbiz.de/10012428656
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Optimum simple step-stress plans using reliability estimate
Ebrahem, Mohammed Al-Haj - In: METRON 70 (2012) 2, pp. 109-120
This paper presents optimum simple step-stress plans under the log-logistic cumulative exposure model. The likelihood …
Persistent link: https://www.econbiz.de/10011000653
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Parametric inference for progressive Type-I hybrid censored data on a simple step-stress accelerated life test model
Ling, Li; Xu, Wei; Li, Minghai - In: Mathematics and Computers in Simulation (MATCOM) 79 (2009) 10, pp. 3110-3121
This paper considers a simple step-stress accelerated life test model under progressive Type-I hybrid censoring scheme …
Persistent link: https://www.econbiz.de/10010749621
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