ASHOUR, A. - In: Surface Review and Letters (SRL) 13 (2006) 01, pp. 87-92
Titanium oxide thin films were prepared by sputtering technique onto glass substrates at room temperature (RT). The structure of the films was confirmed using X-ray diffraction (XRD) and revealed the stoichiometry with an O and Ti ratio of 2. The deposited films at RT were found to be amorphous...