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Search: subject:"Technology's progression"
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Stochastic technology life cycle analysis using multiple patent indicators
Lee, Changyong
;
Kim, Juram
;
Kwon, Ohjin
;
Woo, Han-Gyun
- In:
Technological forecasting & social change : an …
106
(
2016
),
pp. 53-64
Persistent link: https://www.econbiz.de/10011609990
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