Search Results - subject:"Wavelet multiresolution"

SURFACE ROUGHNESS MEASUREMENT USING SHADOWS PRODUCED BY CIRCULATING LIGHT SOURCES

HIRATSUKA, TOMOKAZU; HORIO, KEIICHI; YAMAKAWA, TAKESHI - In: New Mathematics and Natural Computation (NMNC) 05 (2009) 01, pp. 335-352

by a Wavelet Multiresolution Analysis (MRA) from the shadow images produced by the CLS, and are classified by a Self …

Persistent link: https://www.econbiz.de/10005080824

Structural complexity of disordered surfaces: Analyzing the porous silicon SFM patterns

Rosa, R.R.; Baroni, M.P.M.A.; Zaniboni, G.T.; Ferreira … - In: Physica A: Statistical Mechanics and its Applications 386 (2007) 2, pp. 666-673

This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological...

Persistent link: https://www.econbiz.de/10010591068

Persistence Characteristics of the Chinese Stock Markets

Los, Cornelis A.; Yu, Bing - EconWPA - 2005

accuracy range with a new statistic), using wavelet multiresolution analysis (MRA), we identify the markets' subsequent degrees …

Persistent link: https://www.econbiz.de/10005561572