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Search: subject:"and dots) - 81.70.Cv Nondestructive testing: ultrasonic testing"
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(multilayers
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PACS. 72.70.+m Noise processes and phenomena[:AND:]73.61.-r Electrical properties of specific thin films and layer structures
1
and dots) - 81.70.Cv Nondestructive testing: ultrasonic testing
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photoacoustic testing
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Gingl, Z.
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Kiss, L.B.
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Pennetta, C.
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Reggiani, L.
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The European Physical Journal B - Condensed Matter and Complex Systems
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Excess thermal-noise in the electrical breakdown of random resistor networks
Pennetta, C.
;
Kiss, L.B.
;
Gingl, Z.
;
Reggiani, L.
- In:
The European Physical Journal B - Condensed Matter and …
12
(
1999
)
1
,
pp. 61-65
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