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atomic force microscopy 22 Atomic force microscopy 8 X-ray diffraction 5 morphology 3 nonlinear optical materials 3 surface morphology 3 68.37.Ps 2 Atomic force microscopy (AFM) 2 cleavage surface 2 electrical properties 2 magnetron sputtering 2 thin films 2 321 stainless steel films 1 42.79.Gn 1 42.82.Et 1 61.10.-i 1 61.43.Fs Glasses 1 68.03.Cd Surface tension and related phenomena 1 68.35.Ct Interface structure and roughness 1 68.37.Ps Atomic force microscopy (AFM) 1 68.55.-a 1 74.62.Bf 1 78.40Fy 1 78.66-w 1 81.10.Aj 1 81.15.Fg 1 82.65.My 1 AFM 1 AFM- Atomic Force Microscopy 1 Adsorption behavior 1 Amplitude Detection 1 Atomic Force Microscopy 1 Buffer 1 Cermet films 1 Charged surface modifying macromolecules 1 DNase I 1 Deposition 1 Dimensional stability 1 Dislocation growth 1 Dodecylamine 1
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Undetermined 36
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Article 36
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Undetermined 34 English 2
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XU, D. 6 GENG, Y. L. 5 WANG, X. Q. 5 YU, G. W. 4 ZHANG, G. H. 4 LIU, X. J. 3 CHEN, ZHENYU 2 JIN, YONGZHONG 2 LI, HAI 2 LIU, DONGLIANG 2 SUN, Z. H. 2 WANG, HUABIN 2 WANG, PENG 2 WANG, Z. Y. 2 YANG, HAIJUN 2 ZHANG, FENG 2 ZHANG, H. B. 2 ZHU, L. Y. 2 AN, HONGJIE 1 AZIZI, A. 1 Amano, Ken-ichi 1 BEDI, R. K. 1 Barreneche, Camila 1 CAICEDO, J. C. 1 CHAKRABORTY, ADRITA 1 CHEN, JIAN 1 CHEN, SHIMOU 1 CHEN, Z. Y. 1 CUI, Y. L. 1 Cabeza, Luisa F. 1 DAI, SHUXI 1 DING, Y. L. 1 DINIA, A. 1 DU, ZULIANG 1 Diankova, Tamara 1 Dobiński, Grzegorz 1 Dunsteter, F. 1 ESCOBAR, C. 1 ESTEVE, J. 1 FAN, H. L. 1
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Surface Review and Letters (SRL) 29 Physica A: Statistical Mechanics and its Applications 2 Applied Energy 1 International Journal of Measurement Technologies and Instrumentation Engineering (IJMTIE) 1 Journal of Nanotoxicology and Nanomedicine (JNN) 1 Renewable Energy 1 The European Physical Journal B - Condensed Matter and Complex Systems 1
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RePEc 34 Other ZBW resources 2
Showing 1 - 10 of 36
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Amplitude Estimation Technique for Intermittent Contact Atomic Force Microscopy
Dobiński, Grzegorz; Pawłowski, Sławomir; Smolny, Marek - In: International Journal of Measurement Technologies and … 6 (2017) 2, pp. 29-42
presented method implemented in the actual atomic force microscopy system is also demonstrated. …
Persistent link: https://www.econbiz.de/10012046707
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The Nano-Sized TiO2 Dispersions for Mass Coloration of Polyimide Fibers: The Nano-Sized TiO2 for Mass Coloration
Fjodorova, Natalja; Novic, Marjana; Diankova, Tamara; … - In: Journal of Nanotoxicology and Nanomedicine (JNN) 1 (2016) 1, pp. 29-44
The implementation of nano-sized TiO2 dispersions for mass coloration of polyimide fibers is considered in the paper. Titanium dioxide (TiO2) is not classified as hazardous according to United Nations (UN) Globally Harmonized System of Classification and Labeling of Chemicals (GHS). The...
Persistent link: https://www.econbiz.de/10012049187
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Enhancing proton conduction of sulfonated poly (phenylene ether ether sulfone) membrane by charged surface modifying macromolecules for H2/O2 fuel cells
Neelakandan, S.; Kanagaraj, P.; Nagendran, A.; Rana, D.; … - In: Renewable Energy 78 (2015) C, pp. 306-313
.22 × 10−2 S/cm (80 °C). Surface morphology of the membranes was investigated by tapping mode atomic force microscopy (AFM), which …
Persistent link: https://www.econbiz.de/10011208701
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Simple transform methods of a force curve obtained by surface force apparatus to the density distribution of a liquid near a surface
Amano, Ken-ichi; Takahashi, Ohgi - In: Physica A: Statistical Mechanics and its Applications 425 (2015) C, pp. 79-89
We propose two simple methods that transform a force curve obtained by a surface force apparatus (SFA) into a density distribution of a liquid near a surface of the SFA probe. The transform methods are derived based on the statistical mechanics of simple liquids, where the liquid is an ensemble...
Persistent link: https://www.econbiz.de/10011209708
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MONOLAYER CHARACTERISTICS OF CHITOSAN ASSEMBLED IN LANGMUIR FILMS MIXED WITH ARACHIDIC ACID
NATH, JAYASREE; NATH, RANENDU KUMAR; CHAKRABORTY, ADRITA; … - In: Surface Review and Letters (SRL) 21 (2014) 04, pp. 1450049-1
. Atomic force microscopy study confirms the formation of stable uniform CHS–AA films onto solid support. …
Persistent link: https://www.econbiz.de/10010885173
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EVOLUTION OF THE COPPER SURFACE IN THE COURSE OF OXIDATION BY CCl4–L (L=THF, DMF, DMSO): SCANNING PROBE MICROSCOPE STUDY
PANTELEEV, S. V.; MASLENNIKOV, S. V.; IGNATOV, S. K.; … - In: Surface Review and Letters (SRL) 20 (2013) 03, pp. 1350023-1
), CCl4 concentration ≈ 1 mol/L) was studied by atomic force microscopy (AFM) in contact mode. The dynamics of active centers …
Persistent link: https://www.econbiz.de/10011011161
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MECHANICAL AND TRIBOLOGICAL BEHAVIOR OF VN AND HfN FILMS DEPOSITED VIA REACTIVE MAGNETRON SPUTTERING
ESCOBAR, C.; VILLARREAL, M.; CAICEDO, J. C.; ESTEVE, J.; … - In: Surface Review and Letters (SRL) 20 (2013) 03, pp. 1350040-1
-ray analysis (EDX), atomic force microscopy (AFM), scanning electron microscopy (SEM), nanoindentation, pin-on-disc and scratch …
Persistent link: https://www.econbiz.de/10011011165
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SELF-ASSEMBLING BEHAVIOR AND INHIBITION EFFECT OF DODECANETHIOL SELF-ASSEMBLED MONOLAYERS ON COPPER SURFACE
ZHANG, XIULAN; ZHANG, HENG; YANG, YIHONG; CHEN, ZHENYU - In: Surface Review and Letters (SRL) 20 (2013) 03, pp. 1350028-1
were investigated by atomic force microscopy (AFM) and electrochemical methods. The assembling process was monitored by AFM …
Persistent link: https://www.econbiz.de/10010883157
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Physico-chemical and mechanical properties of microencapsulated phase change material
Giro-Paloma, Jessica; Oncins, Gerard; Barreneche, Camila; … - In: Applied Energy 109 (2013) C, pp. 441-448
breaking was determined by Atomic Force Microscopy (AFM). To simulate real conditions in service, assays were done at different … sizes: agglomerates of 150μm diameter formed by small particles of 6μm. Atomic Force Microscopy in nanoindentation mode was …
Persistent link: https://www.econbiz.de/10011041130
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INHIBITION EFFECT OF DODECYLAMINE ON CARBON STEEL CORROSION IN HYDROCHLORIC ACID SOLUTION
CHEN, ZHENYU; HUANG, LING; QIU, YUBING; GUO, XINGPENG - In: Surface Review and Letters (SRL) 19 (2012) 06, pp. 1250060-1
slightly increases activated energy, but greatly reduces pre-exponential factor value. Atomic force microscopy force curves …
Persistent link: https://www.econbiz.de/10010660983
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