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Year of publication
Subject
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binary data analysis 4 multidimensional scaling 4 Assessment 2 Psychology 2 Psychometrics 2 Social Sciences 2 Statistical Theory and Methods 2 Statistics for Social Science, Behavorial Science, Education, Public Policy, and Law 2 Testing and Evaluation 2 consumer psychology 2 maximum likelihood estimation 2 nonlinear probit model 2 stochastic models 2
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Online availability
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Free 2 Undetermined 2
Type of publication
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Article 2 Other 2
Language
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English 2 Undetermined 2
Author
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Cho, Jaewun 2 DeSarbo, Wayne 2 DeSarbo, Wayne S. 2 Jedidi, Kamel 2
Published in...
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Psychometrika 2
Source
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BASE 2 RePEc 2
Showing 1 - 4 of 4
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A stochastic multidimensional scaling procedure for the spatial representation of three-mode, three-way pick any/ J data
DeSarbo, Wayne S.; Jedidi, Kamel - 1991
This paper presents a new stochastic multidimensional scaling procedure for the analysis of three-mode, three-way pick any/ J data. The method provides either a vector or ideal-point model to represent the structure in such data, as well as “floating” model specifications (e.g., different...
Persistent link: https://www.econbiz.de/10009476615
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A stochastic multidimensional scaling vector threshold model for the spatial representation of “pick any/ n ” data
Cho, Jaewun; DeSarbo, Wayne S. - 1989
This paper presents a new stochastic multidimensional scaling vector threshold model designed to analyze “pick any/ n ” choice data (e.g., consumers rendering buy/no buy decisions concerning a number of actual products). A maximum likelihood procedure is formulated to estimate a joint space...
Persistent link: https://www.econbiz.de/10009476610
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A stochastic multidimensional scaling procedure for the spatial representation of three-mode, three-way pick any/J data
Jedidi, Kamel; DeSarbo, Wayne - In: Psychometrika 56 (1991) 3, pp. 471-494
Persistent link: https://www.econbiz.de/10005757922
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A stochastic multidimensional scaling vector threshold model for the spatial representation of “pick any/n” data
DeSarbo, Wayne; Cho, Jaewun - In: Psychometrika 54 (1989) 1, pp. 105-129
Persistent link: https://www.econbiz.de/10005758130
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