Antzoulakos, Demetrios; Rakitzis, Athanasios - In: Journal of Applied Statistics 37 (2010) 7, pp. 1231-1247
To increase the sensitivity of Shewhart control charts in detecting small process shifts sensitizing rules based on runs and scans are often used in practice. Shewhart control charts supplemented with runs rules for detecting shifts in process variance have not received as much attention as...
