Coffman, Valerie R.; Reid, Andrew C.E.; Langer, Stephen A. - In: Mathematics and Computers in Simulation (MATCOM) 82 (2012) 12, pp. 2951-2961
Recent advances in experimental techniques (micro-CT scans, automated serial sectioning, electron back-scatter diffraction, and synchrotron radiation X-rays) have made it possible to characterize the full, three-dimensional structure of real materials. Such new experimental techniques have...