LI, L. X.; LIU, R. P.; ZHANG, D. T.; LI, B. H.; CUI, Y. L. - In: Surface Review and Letters (SRL) 14 (2007) 05, pp. 963-967
Tunneling effect of graphite is studied by atomic force microscopy. The tunneling current in the gap between a conductive tip and a newly cleaved graphite surface at a given voltage keeps almost constant when the gap-distance varies within 1 μm, which cannot be explained by the commonly...