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Cycle time estimation for
semiconductor
final
testing
processes with Weibull-distributed weiting time
Tai, Y. T.
;
Pearn, Wen-lea
;
Lee, J. H.
- In:
International journal of production research
50
(
2012
)
2
,
pp. 581-592
Persistent link: https://www.econbiz.de/10009549619
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