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Search: subject:"sequentially discounting auto regression (SDAR) model learning algorithm"
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Leading indicators for detecting change of technology trends : comparison of patents, papers and newspaper articles in Japan and US
Maeno, Takeshi
;
Iwasawa, Yusuke
;
Matsuo Yutaka
- In:
International journal of innovation and technology …
18
(
2021
)
4
,
pp. 2150017-1-2150017-18
Persistent link: https://www.econbiz.de/10012643546
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