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  • Search: subject:"spurious persistence"
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Year of publication
Subject
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spurious persistence 5 Innovation 3 Spurious persistence 3 dynamic panel data type 2 tobit 3 innovation 3 Dynamic panel data type 2 tobit 2 deterministic trends 2 frequency domain estimation 2 level shifts 2 long-memory 2 robust estimation 2 stochastic volatility 2 structural change 2 Deterministic trends 1 Estimation 1 Estimation theory 1 Frequency domain estimation 1 Level shifts 1 Niederlande 1 Robust estimation 1 Robust statistics 1 Robustes Verfahren 1 Schätztheorie 1 Schätzung 1 Structural break 1 Strukturbruch 1 Time series analysis 1 Verarbeitendes Gewerbe 1 Zeitreihenanalyse 1 données de panel 1 modèle tobit de type II dynamique 1 persistence 1
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Online availability
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Free 7 Undetermined 1
Type of publication
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Book / Working Paper 7 Article 1
Type of publication (narrower categories)
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Working Paper 2 Article in journal 1 Aufsatz in Zeitschrift 1
Language
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English 6 Undetermined 2
Author
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Palm, Franz 5 Raymond, Wladimir 5 Mohnen, Pierre 4 McCloskey, Adam 3 Loeff, Sybrand Schim van der 2 Schim van der Loeff, S. 2 Hill, Jonathan B. 1 Mohnen, Pierre A. 1 van der Loeff, Sybrand Schim 1
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Institution
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Brown University, Department of Economics 1 CESifo 1 Centre Interuniversitaire de Recherche en Analyse des Organisations (CIRANO) 1 United Nations University, Maastricht Economic and social Research and training centre on Innovation and Technology 1 United Nations University-Maastricht Economic Research Institute of Innovation and Technology (UNU-MERIT) 1
Published in...
All
CESifo Working Paper 1 CESifo Working Paper Series 1 CIRANO Working Papers 1 Journal of business & economic statistics : JBES ; a publication of the American Statistical Association 1 MERIT Working Papers 1 UNU-MERIT Working Paper Series 1 Working Paper 1 Working Papers / Brown University, Department of Economics 1
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Source
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RePEc 5 EconStor 2 ECONIS (ZBW) 1
Showing 1 - 8 of 8
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Estimation of the long-memory stochastic volatility model parameters that is robust to level shifts and deterministic trends
McCloskey, Adam - 2012
I provide conditions under which the trimmed FDQML estimator, advanced by McCloskey (2010) in the context of fully parametric short-memory models, can be used to estimate the long-memory stochastic volatility model parameters in the presence of additive low-frequency contamination in log-squared...
Persistent link: https://www.econbiz.de/10010420267
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Estimation of the Long-Memory Stochastic Volatility Model Parameters that is Robust to Level Shifts and Deterministic Trends
McCloskey, Adam - Brown University, Department of Economics - 2012
I provide conditions under which the trimmed FDQML estimator, advanced by McCloskey (2010) in the context of fully parametric short-memory models, can be used to estimate the long-memory stochastic volatility model parameters in the presence of additive low-frequency contamination in log-squared...
Persistent link: https://www.econbiz.de/10011196579
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Parameter estimation robust to low-frequency contamination
McCloskey, Adam; Hill, Jonathan B. - In: Journal of business & economic statistics : JBES ; a … 35 (2017) 4, pp. 598-610
Persistent link: https://www.econbiz.de/10011893837
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Persistence of innovation in Dutch manufacturing : is it spurious?
Raymond, Wladimir; Mohnen, Pierre A.; Palm, Franz; van … - 2006
This paper studies the persistence of innovation and the dynamics of innovation output in Dutch manufacturing using firm data from three waves of the Community Innovation Surveys (CIS), pertaining to the periods 1994-1996, 1996-1998, and 1998-2000. We estimate by maximum likelihood a dynamic...
Persistent link: https://www.econbiz.de/10010276134
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Persistence of Innovation in Dutch Manufacturing: Is it Spurious?
Raymond, Wladimir; Mohnen, Pierre; Palm, Franz; Loeff, … - Centre Interuniversitaire de Recherche en Analyse des … - 2006
This paper studies the persistence of innovation and the dynamics of innovation output in Dutch manufacturing using firm data from three waves of the Community Innovation Surveys (CIS), pertaining to the periods 1994-1996, 1996-1998, and 1998-2000. We estimate by maximum likelihood a dynamic...
Persistent link: https://www.econbiz.de/10005100853
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Persistence of Innovation in Dutch Manufacturing: Is it Spurious?
Mohnen, Pierre; Schim van der Loeff, S.; Palm, Franz; … - United Nations University, Maastricht Economic and … - 2006
: Dynamic panel data type 2 tobit, Innovation, Spurious persistence. JEL classification: C33, C34, O31 * Acknowledgements … innovation when considered on the input side and spurious persistence when taken on the output side. The idea is that persistent …
Persistent link: https://www.econbiz.de/10005150847
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Persistence of Innovation in Dutch Manufacturing: Is it Spurious?
Raymond, Wladimir; Mohnen, Pierre; Palm, Franz; Loeff, … - CESifo - 2006
This paper studies the persistence of innovation and the dynamics of innovation output in Dutch manufacturing using firm data from three waves of the Community Innovation Surveys (CIS), pertaining to the periods 1994-1996, 1996-1998, and 1998-2000. We estimate by maximum likelihood a dynamic...
Persistent link: https://www.econbiz.de/10005181320
Saved in:
Cover Image
Persistence of Innovation in Dutch Manufacturing: Is it Spurious?
Mohnen, Pierre; Schim van der Loeff, S.; Palm, Franz; … - United Nations University-Maastricht Economic Research … - 2006
: Dynamic panel data type 2 tobit, Innovation, Spurious persistence. JEL classification: C33, C34, O31 * Acknowledgements … innovation when considered on the input side and spurious persistence when taken on the output side. The idea is that persistent …
Persistent link: https://www.econbiz.de/10010712308
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