Chang, Tee Chin; Gan, Fah Fatt - In: Journal of Applied Statistics 34 (2007) 7, pp. 857-877
The conventional Shewhart p or np chart is not effective for monitoring a high yield process, a process in which the defect level is close to zero. An improved Shewhart np chart for monitoring high yield processes is proposed. A review of control charts for monitoring high yield processes is...