Search Results - subject:"wafer testing"

Introducing Covering Problems for the Electronic Wafer Test

Deckert, Dominic; Reichelt, Dirk; Holland-Moritz, Peter - In: Operations Research Forum 6 (2025) 3

Semiconductor manufacturing is an essential area of modern industry. Its yield is influenced by a wide variety of different factors, among them machining precision as well as scheduling and processing concerns. To minimize the amount of faulty products, the semiconductors are examined at several...

Persistent link: https://www.econbiz.de/10015485975

COMBINING EVOLUTION STRATEGY WITH ORDINAL OPTIMIZATION

HORNG, SHIH-CHENG; LIN, SHIN-YEU - In: International Journal of Information Technology & … 12 (2013) 02, pp. 233-260

one is the final good enough solution. We apply the proposed algorithm to a wafer testing problem, which is formulated as … algorithm (GA) with OO using extensive simulations in the wafer testing problem, and its computational efficiency is suitable …

Persistent link: https://www.econbiz.de/10010660948

Utilisation of interpretive structural modelling method in the analysis of interrelationship of vendor performance factors

Lin, Ya-Ti; Lin, Chia-Li; Yu, Hsiao-Cheng; Tzeng, … - In: International Journal of Business Performance Management 12 (2011) 3, pp. 260-275

. A case study is conducted to analyse the causal interrelationship of a wafer-testing vendor's performance in Taiwan …

Persistent link: https://www.econbiz.de/10010669245