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  • Search: subject:"wavelet multiresolution analysis"
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Year of publication
Subject
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wavelet multiresolution analysis 2 Chinese equity markets 1 Disordered surfaces 1 Euler characteristic 1 Gradient pattern analysis 1 Hurst exponent 1 KPZ equation 1 Long-term dependence 1 Porous silicon 1 Structural complexity 1 Surface roughness measurement 1 Wavelet multiresolution analysis 1 circulating light sources 1 degrees of persistence 1 electric vehicle (EV) 1 foreign pattern elimination 1 lithium-ion battery 1 online identification 1 partially linear model 1 self-organizing map 1 shadow 1 wavelet multiresolution analysis (MRA) 1
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Online availability
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Undetermined 2 Free 1
Type of publication
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Article 3 Book / Working Paper 1
Language
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Undetermined 4
Author
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Baroni, M.P.M.A. 1 Bolzan, M.J.A. 1 Ferreira da Silva, A. 1 HIRATSUKA, TOMOKAZU 1 HORIO, KEIICHI 1 Jiang, Jiuchun 1 Los, Cornelis A. 1 Mu, Dazhong 1 Pontes, J. 1 Roman, L.S. 1 Rosa, R.R. 1 YAMAKAWA, TAKESHI 1 Yu, Bing 1 Zaniboni, G.T. 1 Zhang, Caiping 1
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Institution
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EconWPA 1
Published in...
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Energies 1 Finance 1 New Mathematics and Natural Computation (NMNC) 1 Physica A: Statistical Mechanics and its Applications 1
Source
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RePEc 4
Showing 1 - 4 of 4
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Online Semiparametric Identification of Lithium-Ion Batteries Using the Wavelet-Based Partially Linear Battery Model
Mu, Dazhong; Jiang, Jiuchun; Zhang, Caiping - In: Energies 6 (2013) 5, pp. 2583-2604
PLBM using the truncated wavelet multiresolution analysis (MRA) expansion, which leads to a parsimonious model structure …
Persistent link: https://www.econbiz.de/10010668157
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SURFACE ROUGHNESS MEASUREMENT USING SHADOWS PRODUCED BY CIRCULATING LIGHT SOURCES
HIRATSUKA, TOMOKAZU; HORIO, KEIICHI; YAMAKAWA, TAKESHI - In: New Mathematics and Natural Computation (NMNC) 05 (2009) 01, pp. 335-352
by a Wavelet Multiresolution Analysis (MRA) from the shadow images produced by the CLS, and are classified by a Self …
Persistent link: https://www.econbiz.de/10005080824
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Structural complexity of disordered surfaces: Analyzing the porous silicon SFM patterns
Rosa, R.R.; Baroni, M.P.M.A.; Zaniboni, G.T.; Ferreira … - In: Physica A: Statistical Mechanics and its Applications 386 (2007) 2, pp. 666-673
This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological...
Persistent link: https://www.econbiz.de/10010591068
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Persistence Characteristics of the Chinese Stock Markets
Los, Cornelis A.; Yu, Bing - EconWPA - 2005
accuracy range with a new statistic), using wavelet multiresolution analysis (MRA), we identify the markets' subsequent degrees …
Persistent link: https://www.econbiz.de/10005561572
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