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~person:"Kim, Deok-hwan"
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Search: subject_exact:"LCD (Liquid Cristal Display)"
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Kim, Deok-hwan
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An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses
Noh, Chung-ho
;
Lee, Seok-lyong
;
Kim, Deok-hwan
;
Chung, …
- In:
International journal of production research
48
(
2010
)
17/18
,
pp. 5115-5135
Persistent link: https://www.econbiz.de/10009125446
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