KHAN, MAJID; ISLAM, MOHAMMAD; AKRAM, AFTAB; MANZOOR, UMAIR - In: Surface Review and Letters (SRL) 20 (2013) 06, pp. 1350065-1
Molybdenum thin films were sputter deposited under different conditions of DC power and chamber pressure. The structure and topography of the films were investigated using AFM, SEM and XRD techniques. Van der Pauw method and tape test were employed to determine electrical resistivity and...