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person:"Albrecht, Duane G."
~person:"Aparicio, Juan"
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Search: subject_exact:"Mustererkennung"
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Mustererkennung
4
Data envelopment analysis
3
Data-Envelopment-Analyse
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Pattern recognition
3
Technical efficiency
3
Technische Effizienz
3
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Austin <Tex., 1979>
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Albrecht, Duane G.
Aparicio, Juan
Härdle, Wolfgang
17
Hong, Wei-Chiang
14
Papadimitriou, Theophilos
11
Gkonkas, Periklēs
10
Schäfer, Dorothea
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Rüping, Stefan
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Sermpinis, Georgios
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Stasinakis, Charalampos
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Jeong, Kiho
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Luo, Jian
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Yeh, Yi-Ren
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Computers & operations research : and their applications to problems of world concern ; an international journal
1
Lecture notes in biomathematics
1
Omega : the international journal of management science
1
Operational research : an international journal
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1
Measuring technical efficiency for multi-input multi-output production processes through OneClass Support Vector Machines : a finite-sample study
Moragues, Raul
;
Aparicio, Juan
;
Esteve, Miriam
- In:
Operational research : an international journal
23
(
2023
)
3
,
pp. 1-33
Persistent link: https://www.econbiz.de/10014364592
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2
Multi-output support vector frontiers
Valero-Carreras, Daniel
;
Aparicio, Juan
- In:
Computers & operations research : and their …
143
(
2022
),
pp. 1-17
Persistent link: https://www.econbiz.de/10013343235
Saved in:
3
Support vector frontiers : a new approach for estimating production functions through support vector machines
Valero-Carreras, Daniel
;
Aparicio, Juan
;
Guerrero, Nadia M.
- In:
Omega : the international journal of management science
104
(
2021
),
pp. 1-19
Persistent link: https://www.econbiz.de/10012648547
Saved in:
4
Recognition of pattern and form : proceedings of a conference held at the Univ. of Texas at Austin, March 22 - 24, 1979
Albrecht, Duane G.
(
contributor
)
-
1982
Persistent link: https://www.econbiz.de/10009603712
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