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~subject:"Panel study"
~person:"Franses, Philip Hans"
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Search: subject_exact:"Random intercepts model"
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A multi-level panel star model for us manufacturing sectors
Fok, Dennis
;
Dijk, Dick van
;
Franses, Philip Hans
- In:
Journal of applied econometrics
20
(
2005
)
6
,
pp. 811-827
Persistent link: https://www.econbiz.de/10003168966
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