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~person:"Hoti, Suhejla"
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How does country risk affect innovation? : An application to foreign patents registered in the USA
Hoti, Suhejla
;
McAleer, Michael
- In:
Economic and legal issues in intellectual property
,
(pp. 207-230)
.
2007
Persistent link: https://www.econbiz.de/10003542693
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