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subject:"Theory"
~person:"Batabyal, Amitrajeet A."
~isPartOf:"International review of economics & finance : IREF"
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Is there a tradeoff between average patent pendency and examination errors?
Batabyal, Amitrajeet A.
;
Nijkamp, Peter
- In:
International review of economics & finance : IREF
17
(
2008
)
1
,
pp. 150-158
Persistent link: https://www.econbiz.de/10003749810
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